Issued Patents 2017
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9746428 | Inline inspection of the contact between conductive traces and substrate for hidden defects using white light interferometer with tilted objective lens | Shuhong Liu, Zhiyong Wang, Deepak Goyal | 2017-08-29 |