IW

Ifar Wan

IN Intel: 2 patents #1,256 of 5,604Top 25%
Overall (2017): #145,761 of 506,227Top 30%
2
Patents 2017

Issued Patents 2017

Patent #TitleCo-InventorsDate
9564245 Integrated circuit defect detection and repair Bruce Querbach, Theodore Z. Schoenborn, David J. Zimmerman, David G. Ellis, Christopher W. Hampson +3 more 2017-02-07
9548137 Integrated circuit defect detection and repair Bruce Querbach, William K. Lui, David G. Ellis, David J. Zimmerman, Theodore Z. Schoenborn +2 more 2017-01-17