Issued Patents 2017
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9759763 | Damage reduction method and apparatus for destructive testing of power semiconductors | Rodney E. Schwartz, David A. Lohr, Gary Rogers, James Baggiore | 2017-09-12 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9759763 | Damage reduction method and apparatus for destructive testing of power semiconductors | Rodney E. Schwartz, David A. Lohr, Gary Rogers, James Baggiore | 2017-09-12 |