Issued Patents 2017
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9726713 | Testing method and testing system for semiconductor element | Tzung-Te Chen, Chun-Fan Dai, Han-Kuei Fu, Pei-Ting Chou | 2017-08-08 |
| 9557368 | Method of measuring thermal electric characteristics of semiconductor device | Tzung-Te Chen, Pei-Ting Chou | 2017-01-31 |