Issued Patents 2017
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9626267 | Test generation using expected mode of the target hardware device | Sung-Boem Park, Amir Nahir, Vitali Sokhin, Jin-Sung Park, Ara Cho | 2017-04-18 |
| 9569345 | Architectural failure analysis | Ophir Friedler, Amir Nahir, Vitali Sokhin | 2017-02-14 |