Issued Patents 2017
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9664741 | Test method and test apparatus for testing a plurality of blocks in a circuit | Fei DONG, Hai Long Li, Yin Peng Lv, Liu Di Wang | 2017-05-30 |
SG
Shu Gong
Overall (2017): #245,909 of 506,227Top 50%
1
Patents 2017