Issued Patents 2017
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9562945 | Modifying a scan chain for improved fault diagnosis of integrated circuits | Liang Chen, Teng Lin, Yang Liu | 2017-02-07 |
GJ
Guofan Jiang
Overall (2017): #411,263 of 506,227Top 85%
1
Patents 2017