{"@context": "https://schema.org", "@type": "BreadcrumbList", "itemListElement": [{"@type": "ListItem", "position": 1, "name": "Home", "item": "https://www.patentleaderboard.com/"}, {"@type": "ListItem", "position": 2, "name": "2017", "item": "https://www.patentleaderboard.com/2017/"}, {"@type": "ListItem", "position": 3, "name": "IBM", "item": "https://www.patentleaderboard.com/2017/company/ibm"}, {"@type": "ListItem", "position": 4, "name": "Daniel Piper", "item": "https://www.patentleaderboard.com/2017/inventor/fl:da_ln:piper-7"}]}

Home › 2017 › IBM › Daniel Piper

Daniel Piper — 1 Patent in 2017

WAWafertech: 1 patents #1 of 10Top 10%

Vancouver, WA: #80 of 240 inventorsTop 35%

Washington: #4,569 of 12,901 inventorsTop 40%

Overall (2017): #446,123 of 506,227Top 90%

1 Patents 2017

Issued Patents 2017

Showing 1–1 of 1 patents

Patent #	Title	Co-Inventors	Date
9564382	Test structure for determining overlay accuracy in semiconductor devices using resistance measurement	—	2017-02-07

Daniel Piper — 1 Patent in 2017

Issued Patents 2017

Patent Widget