Issued Patents 2017
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9632110 | Semiconductor element inspection device and inspection method | Shigeto Akahori, Shinyu Hirayama, Hiroyuki Yamagishi | 2017-04-25 |
| 9541577 | Current application device and manufacturing method of semiconductor element | Satoshi Hasegawa, Shigeto Akahori, Shinya Maita, Hitoshi Saito | 2017-01-10 |