Issued Patents 2017
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9773640 | Sample holder, charged particle beam apparatus, and observation method | Tomokazu Shimakura, Hideo Kashima | 2017-09-26 |
| 9601306 | Sample micromotion mechanism, method of using the same, and charged particle device | Naruo Watanabe | 2017-03-21 |