Issued Patents 2017
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9668658 | Measurement apparatus | Hironori Sato, Naoki Mori, Tomoko Hashimoto, Shozo TAKAMATSU, Hideo Utsuno +2 more | 2017-06-06 |
| 9589765 | Sample supporting member for observing scanning electron microscopic image and method for observing scanning electron microscopic image | — | 2017-03-07 |
| 9552959 | Sample holder for scanning electron microscope, scanning electron microscope image observation system, and scanning electron microscope image observation method | — | 2017-01-24 |