Issued Patents 2017
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9754762 | Electron microscope and sample observation method | Toshie Yaguchi, Hiroyuki Kobayashi | 2017-09-05 |
| 9754763 | Electron microscope | Toshiyuki Oyagi | 2017-09-05 |
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9754762 | Electron microscope and sample observation method | Toshie Yaguchi, Hiroyuki Kobayashi | 2017-09-05 |
| 9754763 | Electron microscope | Toshiyuki Oyagi | 2017-09-05 |