Issued Patents 2017
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9772352 | Prober having linkage portion, method for manufacturing the prober and method of testing circuit boards using the prober | Masashi Kobayashi | 2017-09-26 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9772352 | Prober having linkage portion, method for manufacturing the prober and method of testing circuit boards using the prober | Masashi Kobayashi | 2017-09-26 |