Issued Patents 2017
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9618550 | Apparatus for frequency analyzing a measurement target and method of frequency analyzing a measurement target | Tomonori Nakamura, Akihiro Otaka | 2017-04-11 |
| 9618563 | Semiconductor device inspection device and semiconductor device inspection method | Tomonori Nakamura | 2017-04-11 |
| 9618576 | Apparatus for testing a semiconductor device and method of testing a semiconductor device | Akihiro Otaka, Nobuyuki Hirai, Tomonori Nakamura | 2017-04-11 |
| 9562944 | Semiconductor device inspection device and semiconductor device inspection method | Tomonori Nakamura | 2017-02-07 |