Issued Patents 2017
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9606065 | Quantitative analysis method for measuring target element in specimen using laser-induced plasma spectrum | Jeonghwan IN, Chan-Kyu Kim, Seokhee Lee | 2017-03-28 |
| 9557273 | Quantitative analyzing method of CIGS film using a laser induced breakdown spectroscopy | Jeong Hwan IN, Chan-Kyu Kim, Seokhee Lee, Hakjae LEE | 2017-01-31 |