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Satoko Nakagawa

GCGlobalwafers Japan Co.: 1 patents #1 of 2Top 50%
Overall (2017): #253,596 of 506,227Top 55%
1 Patents 2017

Issued Patents 2017

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
9541452 Calibration curve formation method, impurity concentration measurement method, and semiconductor wafer manufacturing method Kazuhiko Kashima 2017-01-10

Nearby-Ranked Inventors

Saki Nakamura1
Satoshi Nakama1
Satoko Nakajima1
Satoru Nakahata1
Satoru Nakagawa1
Said Naji1
Sarah Elizabeth Najar1
Satyajit Nair1
Sanal Kumar Sundaresan Nair1