Issued Patents 2017
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9791849 | Defect detection process in a semiconductor manufacturing environment | David F. Cutilli, Keith A. Robishaw, Glenn M. Stefanski | 2017-10-17 |
MH
Matthew J. Hartnett
Overall (2017): #324,666 of 506,227Top 65%
1
Patents 2017