Issued Patents 2017
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9733302 | Circuit for monitoring metal degradation on integrated circuit | John M. Pigott, Chuanzheng Wang, Qilin Zhang, Michael J. Zunino | 2017-08-15 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9733302 | Circuit for monitoring metal degradation on integrated circuit | John M. Pigott, Chuanzheng Wang, Qilin Zhang, Michael J. Zunino | 2017-08-15 |