Issued Patents 2017
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9575093 | System for the combined, probe-based mechanical and electrical testing of MEMS | Felix Beyeler, Daniel Frost, David Beyeler, Simon Muntwyler | 2017-02-21 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9575093 | System for the combined, probe-based mechanical and electrical testing of MEMS | Felix Beyeler, Daniel Frost, David Beyeler, Simon Muntwyler | 2017-02-21 |