MC

Martin Cafourek

FE Fei: 2 patents #11 of 122Top 10%
Overall (2017): #128,425 of 506,227Top 30%
2
Patents 2017

Issued Patents 2017

Showing 1–2 of 2 patents

Patent #TitleCo-InventorsDate
9741527 Specimen holder for a charged particle microscope Tomas Vystavel, Josef Sestak, Pavel Poloucek, Lubomir Tuma, Michal Hrouzek +1 more 2017-08-22
9679741 Environmental cell for charged particle beam system Libor Novak, Marek Uncovsky, Milos Toth, William Parker, Marcus Straw +1 more 2017-06-13