AH

Alexander Henstra

FE Fei: 2 patents #11 of 122Top 10%
📍 Utrecht, OR: #1 of 1 inventorsTop 100%
Overall (2017): #172,969 of 506,227Top 35%
2
Patents 2017

Issued Patents 2017

Showing 1–2 of 2 patents

Patent #TitleCo-InventorsDate
9741525 Charged-particle microscope with astigmatism compensation and energy-selection Bohuslav Sed'a, Lubomir Tuma 2017-08-22
9570270 Method of using an environmental transmission electron microscope Peter Christiaan Tiemeijer, Stan Johan Pieter Konings 2017-02-14