MJ

Mark R. Swenson, Jr.

DI Dorsey Metrology International: 1 patents #1 of 2Top 50%
📍 Poughkeepsie, NY: #179 of 296 inventorsTop 65%
🗺 New York: #4,556 of 12,278 inventorsTop 40%
Overall (2017): #315,404 of 506,227Top 65%
1
Patents 2017

Issued Patents 2017

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
9797713 Contour probe linkage for a horizontal beam optical comparator John C. Bishop 2017-10-24