Issued Patents 2017
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9736389 | Device and method for characterizing a sample using localized measurements | Alexander Podzorov | 2017-08-15 |
| 9709441 | Spectrometer of high diffraction efficiency for analyzing the spectrum of a light beam | Simon Richard | 2017-07-18 |
| 9638635 | Spectrometer for analysing the spectrum of a light beam | Simon Richard, Christian Brach, Viviane Millet, Sebastien Corde, Daphne Heran | 2017-05-02 |
| 9551618 | Wavefront-division polarimetric analysis method and device, spectropolarimeter, polarimetric camera and optical microscope using such a device | Simon Richard, Thanh-Liem Nguyen | 2017-01-24 |