Issued Patents 2017
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9810713 | Method and apparatus of operating a scanning probe microscope | Jian Shi, Yan Hu, Ji Ma, Chanmin Su | 2017-11-07 |
| 9739799 | Method and apparatus to compensate for deflection artifacts in an atomic force microscope | Chanmin Su | 2017-08-22 |
| 9588136 | Method and apparatus of operating a scanning probe microscope | Yan Hu, Chanmin Su | 2017-03-07 |
| 9575090 | Force measurement with real-time baseline determination | Changchun Liu, Bede Pittenger, Chanmin Su | 2017-02-21 |