Issued Patents 2017
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9739833 | Scan chain for memory sequential test | Jixiang Hou, Li Liu, Yin Lu, Liudi Wang | 2017-08-22 |
HL
Hailong Li
Overall (2017): #408,019 of 506,227Top 85%
1
Patents 2017