Issued Patents 2017
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9551690 | Profiling tool for determining material thickness for inspection sites having complex topography | Michel Gaudet, Glenn Curtis Longhurst, Kristopher Jones, Stuart Thomas Craig, David Walter Dunford +3 more | 2017-01-24 |