Issued Patents 2017
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9627091 | Memory device and stress testing method of same | Hsi-Hsien Hung | 2017-04-18 |
| 9576652 | Resistive random access memory apparatus with forward and reverse reading modes | Seow Fong Lim, Douk-Hyoun Ryu, Chi-Shun Lin | 2017-02-21 |