Issued Patents 2017
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9824852 | CD-SEM technique for wafers fabrication control | Roman Kris, Yakov Weinberg, Yan Ivanchenko, Dan Lange, Arbel Englander +3 more | 2017-11-21 |
| 9715724 | Registration of CAD data with SEM images | Yan Ivanchenko, Daniel Ravid, Orly ZVITIA, Idan Kaizerman | 2017-07-25 |
| 9674536 | Technique for visualizing elements in images by color coding | Yakov Weinberg, Hagai Kirshner | 2017-06-06 |
| 9595091 | Defect classification using topographical attributes | Idan Kaizerman, Efrat Rozenman | 2017-03-14 |