Issued Patents 2017
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9548136 | Method to identify extrinsic SRAM bits for failure analysis based on fail count voltage response | Vivek Joshi, Sriram Balasubramanian, Yoann Mamy Randriamihaja, William F. McMahon | 2017-01-17 |