Issued Patents 2017
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9709598 | Scanning ion conductance microscopy using surface roughness for probe movement | Pavel Novak, Chao Li, Andrew Shevchuk, David Klenerman, Yuri Evgenievich Korchev +2 more | 2017-07-18 |