JM

Jim McKenna

AT Advanced Testing Technologies: 1 patents #1 of 6Top 20%
📍 Bohemia, NY: #3 of 9 inventorsTop 35%
🗺 New York: #4,556 of 12,278 inventorsTop 40%
Overall (2017): #375,178 of 506,227Top 75%
1
Patents 2017

Issued Patents 2017

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
9739827 Automated waveform analysis using a parallel automated development system Robert Spinner, Eli Levi, William Harold Leippe, William Biagiotti, Richard Engel 2017-08-22