Issued Patents 2016
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9429623 | Solution for full speed, parallel DUT testing | W Scott Villareal Filler, Ahmed S. Tantawy | 2016-08-30 |
| 9335347 | Method and apparatus for massively parallel multi-wafer test | John Andberg, Ira Leventhal, Matthew Losey, Yohannes Desta, Lakshmikanth Namburi +2 more | 2016-05-10 |