Issued Patents 2016
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9467138 | Semiconductor apparatus | — | 2016-10-11 |
| 9379029 | Inspection apparatus, inspection system, inspection method of semiconductor devices, and manufacturing method of inspected semiconductor devices | Takashi Ushijima | 2016-06-28 |