Issued Patents 2016
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9431288 | System and method for test key characterizing wafer processing state | Clement Hsingjen Wann, Ling-Yen Yeh, Chi-Yuan Shih | 2016-08-30 |
| 9412847 | Self-aligned passivation of active regions | Clement Hsingjen Wann, Ling-Yen Yeh, Chi-Yuan Shih | 2016-08-09 |
| 9349659 | Methods for probing semiconductor fins and determining carrier concentrations therein | Clement Hsingjen Wann, Yasutoshi Okuno, Ling-Yen Yeh, Chi-Yuan Shih, Yuan Shao | 2016-05-24 |