Issued Patents 2016
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9502315 | Electrical component testing in stacked semiconductor arrangement | Hao-Chieh Chan | 2016-11-22 |
| 9366709 | Circuit and method for delay difference measurement | — | 2016-06-14 |
| 9293294 | Frequency dependent clock apparatus and method | Tsung-Hsin Yu | 2016-03-22 |