Issued Patents 2016
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9454149 | Extracting attribute fail rates from convoluted systems | John Kim, Christophe Suzor, Karen Movsisyan | 2016-09-27 |
| 9292650 | Identifying layout pattern candidates | Rafik Marutyan, John Kim, Christophe Suzor | 2016-03-22 |