Issued Patents 2016
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9471745 | Chip cross-section identification and rendering analysis | Xi-Wei Lin | 2016-10-18 |
| 9454635 | Virtual layer generation during failure analysis | — | 2016-09-27 |
| 9430606 | Failure analysis and inline defect characterization | — | 2016-08-30 |