Issued Patents 2016
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9324155 | Systems and methods for determining parameters for image analysis | Paulo Ricardo Mendonca, Dirk Ryan Padfield, Chandan Kumar Mallappa Aladahalli, Theresa Rose Broniak | 2016-04-26 |
| 9305345 | System and method for image based inspection of an object | Ser Nam Lim, Jose Abiel Garza, David Scott Diwinsky, Li Guan, Xingwei Yang +1 more | 2016-04-05 |
| 9251582 | Methods and systems for enhanced automated visual inspection of a physical asset | Ser Nam Lim, Vinod Padmanabhan Kumar, Russell Robert Irving, John Brandon Laflen, Li Guan +1 more | 2016-02-02 |