Issued Patents 2016
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9453800 | Apparatus and method of inspecting a defect of an object | Akio Ishikawa, Mitsuhiro Togashi | 2016-09-27 |
MN
Mitsunori Numata
Overall (2016): #288,304 of 481,213Top 60%
1
Patents 2016