JP

Jun So Pak

KAIST: 1 patents #666 of 1,884Top 40%
SH Sk Hynix: 1 patents #437 of 941Top 50%
Overall (2016): #339,312 of 481,213Top 75%
1
Patents 2016

Issued Patents 2016

Patent #TitleCo-InventorsDate
9459309 Test device, semiconductor device and testing method thereof Jun Ho Lee, Joung-Ho Kim 2016-10-04