Issued Patents 2016
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9291669 | Semiconductor device, test structure of the semiconductor device, and method of testing the semiconductor device | Jin Lee, Jun-Woo Lee, Sang-Goo Jung, Kyoung Mi Park, In Ae Lee | 2016-03-22 |
IL
Il-Kwon Lee
Overall (2016): #373,018 of 481,213Top 80%
1
Patents 2016