Issued Patents 2016
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9464991 | Method for inspecting polysilicon layer | Suk Ho Lee, Jae-Seung Yoo, Kyung-Hoe Heo, Gyoo-Wan Han | 2016-10-11 |
| 9460930 | Method for performing laser crystallization | Nang-Lyeom Oh, Je-Kil Ryu, Gyoo-Wan Han | 2016-10-04 |
| 9389197 | Barrier film defect detecting method and apparatus | Gyoo-Wan Han, Ji Hun Jung | 2016-07-12 |
| 9347886 | Apparatus for monitoring deposition rate, apparatus provided with the same for depositing organic layer, method of monitoring deposition rate, and method of manufacturing organic light emitting display apparatus using the same | Dmitry Maslov, Gyoo-Wan Han | 2016-05-24 |