Issued Patents 2016
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9372078 | Detecting thickness variation and quantitative depth utilizing scanning electron microscopy with a surface profiler | Kurt C. Ruthe | 2016-06-21 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9372078 | Detecting thickness variation and quantitative depth utilizing scanning electron microscopy with a surface profiler | Kurt C. Ruthe | 2016-06-21 |