Issued Patents 2016
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9464992 | Automated wafer defect inspection system and a process of performing such inspection | Jeffrey O'Dell, Thomas Verburgt, Cory Watkins | 2016-10-11 |
| 9337071 | Automated wafer defect inspection system and a process of performing such inspection | Jeffrey O'Dell, Thomas Verburgt, Cory Watkins | 2016-05-10 |