Issued Patents 2016
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9524545 | Apparatus, system, method and storage medium for image inspection result determination and verifying false defect detections due to position matching errors | — | 2016-12-20 |
| 9313341 | Image test apparatus and system for calculating a stack position of a sheet including a defective image | Hiromitsu Miyagawa | 2016-04-12 |