Issued Patents 2016
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9341674 | Scan test circuit, test pattern generation control circuit, and scan test control method | Norihiro Yamada | 2016-05-17 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9341674 | Scan test circuit, test pattern generation control circuit, and scan test control method | Norihiro Yamada | 2016-05-17 |