Issued Patents 2016
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9230817 | Apparatus and method for monitoring a thickness of a silicon wafer with a highly doped layer | Christoph Dietz | 2016-01-05 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9230817 | Apparatus and method for monitoring a thickness of a silicon wafer with a highly doped layer | Christoph Dietz | 2016-01-05 |