Issued Patents 2016
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9523714 | Electrical inspection of electronic devices using electron-beam induced plasma probes | Alexander Kadyshevitch, Ofer Kadar, Arie Glazer, Ronen Loewinger, Daniel Toet | 2016-12-20 |
| 9523873 | System and method for direct imaging | Stefan Heinemann, Wolfgang Retschke, Holger Wagner, Jonas Burghoff | 2016-12-20 |