Issued Patents 2016
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9400307 | Test system for improving throughout or maintenance properties of semiconductor testing | Hiroshi Tamura, Tomonobu Hiramatsu | 2016-07-26 |
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9400307 | Test system for improving throughout or maintenance properties of semiconductor testing | Hiroshi Tamura, Tomonobu Hiramatsu | 2016-07-26 |