Issued Patents 2016
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9355919 | Methods and systems for inspecting bonded wafers | Markus Estermann, Christoph Kappel, Reza Kharrazian | 2016-05-31 |
| 9236225 | Ion sources, systems and methods | Billy W. Ward, John A. Notte, IV, Louis S. Farkas, III, Randall G. Percival, Raymond Hill +3 more | 2016-01-12 |